Khan, MD. Jakaria Yusuf; Rahman, Md. Shafquatur; Hasan, Mehedi
(East West University, 9/11/2015)
We performed a feasibility study of tailoring sensitivity of Si nanowire through backgate bias
arrangement for various NW length and thickness. Three different thicknesses of 100 nm, 50 nm
and 25 nm were chosen and each ...